Machine vision solution for high resolution inspection in displays integrated by the main manufacturers of smartphones and tablets. Also extendable for inspection of wafers and solar panels.

By means of an electronic analysis it is possible to determine a hypothetical behavior assigned to the pixels that make up the displays, however, not all variables are considered. A visual inspection task is essential for checking and verifying their actual behaviour.

Flat panel inspection.

Semiconductor technology has evolved exponentially, with a tendency to reduce the size of integrated electronic circuits, generating a greater concentration of elements: in this case a higher resolution in the same space. A fact that requires a parallel evolution in the acquisition devices used for its inspection, which requires an inspection by means of high resolution acquisition devices that guarantee the correct pixel by pixel operation of the screens.

The system includes the integration of acquisition devices with a resolution of 47 MP to ensure sufficient accuracy for the complete analysis of the display pixel matrix. Another possible option for achieving high resolutions would be to integrate linear acquisition devices but these are too exposed to the trajectory of the object displacement and by focusing on very small inspection areas, a small movement affects the invalidity of the system.